Установка сканирующей зондовой микроскопии для микроскопии, спектроскопии и поляриметрии ближнего поля
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СОМБП является в настоящее время интенсивно развивающимся методом изучения оптических свойств субмикрои наноструктур со сверхвысоким пространственным разрешением, который позволяет получать информацию о различных (в том числе спектральных и поляризационных) оптических свойствах объектов с разрешением, значительно превышающим дифракционный предел, т. е. много меньшим, чем длина волны оптического… Читать ещё >
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